Test and Measurement

Test and Measurement

Since 1964, Electro Optical Industries has provided leading-edge IR test equipment to manufacturers, test centers, universities and research labs all around the world. EOI’s Test and Metrology offerings encompass blackbodies and integrating sphere based visible sources, multispectral collimators and software for Electro Optical systems testing, Focal Plane Arrays test benches and testing systems for NVDs or visible cameras. 

In addition to the quest for technical excellence, we strive to offer a complete metrology solution for our customers, by sharing our experience and best practices, from consultancy to training and personalized commissioning for our integrated tools. 

  • Blackbodies

    Reference IR sources

    With over the fifty years in the business of commercial blackbodies, we at EOI, have provided thousands of diverse blackbodies to customers in just about every corner of the world. Our customers span from industrial applications to government labs and everything in between. Our blackbodies set the standard for highest temperature & highest emissivity with knowledgeable experts to address your questions and concerns every step of the way!  

  • UV-VIS-SWIR Integrating Sphere Sources

    EOI's integrating sphere sources set the standard for stability and ease of use. With capability to cover the UV-Vis-SWIR spectrums, whether you want to measure total flux output or create a source of uniform radiance, we are confident we have a product to meet your needs.


  • Electro-Optical test software

    Universal & Easy-To-Use Test Solution

    Infratest is a powerful software to test laser rangefinders, NIR and IR cameras, ICCDs, visible, and goggles.

  • Collimators and FLIR Test Sets

    The EOI LC series of high resolution, reflecting collimators provide a collimated source of infrared or visible energy to a system under test.

  • BIRD - Universal Electro-Optic Test Bench for IR Detectors

    Calibration and test of IRFPA detectors:

    • Non-uniformity correction,
    • Dynamic range, linearity,
    • Noise tests: fixed pattern noise, temporal noise, NETD responsivity, detectivity, 3D-noise, 2D-detectivity,
    • Bad pixel localization,
    • Crosstalk, MTF,
    • Spectral response.