Targets for infrared and visible test
EOI can provide a wide range of targets of various patterns and sizes for characterization of visible and infrared optronic systems.
Adaptable targets to your tests
Four bar patterns or "targets" are the most commonly used standard for determining the performance of infrared imagers. A series of pattern sizes and temperature contrasts are used to determine the minimum resolvable temperature of the imager at various frequencies. As the target bars get smaller, (i.e. higher frequency), a higher temperature contrast is required to resolve the bar pattern. The highest frequency that can be resolved is referred to as the cut off frequency or the Nyquist frequency.
The targets are frequently mounted in either a manual or motorized target wheel for ease of testing. Individual targets are normally mounted in a square target holder while Wheel targets are normally mounted in a round target holder that permits rotation of the target to test anti-aliasing.
Besides standard four-bar targets, EOI can also provide reflective or other specialized targets for specific test requirements. Contact EOI with your requirements.
The most commonly used patterns are:
||Multiple 4 Bar|
||Slit - Horiz, Vert or at an Angle|
||Bore Sight Alignment|
||"Pin Cushion" or Distortion|
||Custom Tactical Targets|