Feb 2017 T&M
Join us next month at the SPIE DCS Show in Anaheim!
At next month's SPIE Defense and Commercial Sensing Exhibition, EOI will be presenting their newest product: the VGI-150. The veiling glare index test is the measurement of the light scatter in a lens system done by determining the contrast between black and white target areas. The unique design incorporates a sphere within a sphere making the system more compact than any other existing sphere for the same application, allowing for an easy deployment on a production line.
SPIE DCS takes place from April 11-13th at the Anaheim Convention Center, in Anaheim, CA. Visit EOI's booth 526!
| Introducing: DMS800 - Detector Measurement System 
For a complete and exhaustive test of IRFPA detectors, the DMS800 can provide noise tests (with fixed pattern noise, temporal noise, NETD responsivity, detectivity, 3D-noise, and 2D detectivity), non-uniformity correction, bad pixel localization, spectral response and MTF...Read more about it here! |
| New Features added to EOI's High Temperature Extended Area Blackbodies Our NEW high temperature extended area blackbody model, the ECN100 VH6, now emits up to 800°C over a 36 in² surface. We also offer enhanced temperature ranges on ECN100 H6 and H12 with a true radiometric emitted temperature up to 600°C. 
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