From the visible to far infrared spectrum, multi-element optical detectors can be qualified with Electro Optical Industries' fully integrated optronic test benches.
In recent years, IRFPA manufacturers have been developing detector arrays with wider spectral ranges, lower dot pitches, and an ever-increasing number of pixels to fulfill demands. This had made determining the full measurement of the main characteristics of these dense focal plane arrays very difficult to determine.
EOI’s BIRD bench allows the user to automatize the measurement of the main characteristics of multi-element detectors. Included with the BIRD bench: an optical table, with the reference sources and monochromator, a control cabinet, with the signal generators, amplifiers and controllers, and dedicated software for data acquisition and processing.
Performance, both at array and pixels levels, can be assessed with the highest level of accuracy and efficiently tests the following parameters: noise measurement (NETD, RMS noise, fixed pattern noise), Image quality (MTF, non uniformity), pixel default (bad pixel, crosstalk, pixel surface response, detectivity).