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CES375 Series Extended Area Sources

System Use and Description

The CES375 extended area sources provide stable and uniform graybody radiation for test and calibration of infrared sensors and systems. These sources feature fast slew rate, PID control, digital display of set temperature and actual temperature and optional RS232 computer interface. They are designed for laboratory or field use with the controller and emitting surface located in one housing.

Configuration

They are designed for laboratory or field use with the controller and emitting surface located in one housing. Emitting surface sizes are 6" x 6" and to 12" x 12".

CES375

Special Features

The CES Series Extended Area Sources are supplied with a digital controller that provides the following features:

! PID closed loop compensation techniques for fast slew
    rates and settling times. 

! LED display of actual temperature and set temperature.

! Closed case calibration via front panel.

! Keypad input of temperature.

! Optional RS232 computer interface.

 

Computer Interfaces

Computerized control of the system is available through the optional RS232 interface. The interface enables selection of setpoint and readout of actual temperature.

Calibration 

Each CES375 System is calibrated at EOI prior to shipment. Recommended calibration cycle is 6 months. Calibration is traceable to NIST.

  Specifications

Temperature Range: 50 to 375°C
Setpoint Resolution: 1°C
Display Resolution: 1°C
Emissivity: 0.89 avg. at 3-5nm

0.93 avg. at8-12 nm

Stability: ±0.25°C
Emitting Surface Area: 6" x 6"
or
12" x 12"

Source Dimension in Inches

Model
Number

Depth to
Emitting
Surface

Emitting
Surface
Size

Width

Depth

Height

Optical
Height

A

B

C

D

E

F

CES375-06

2.1

6.0

12.0

11.3

12.0

6.0

CES375-12

2.1

12.0

18.9

11.3

18.9

9.4

This is data sheet EO709. Information regarding this data sheet and any requests for data sheets may be directed to  eoi@electro-optical.com.


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