EOI - News and Events

News and Events

Stephen Scopatz and Jason Mazzetta will present Papers at SPIE Defense, Security, and Sensing 2010. Click here to see the abstracts and the schedules.
September 2009 issue of Photonics Tech Briefs magazine publishes “Comparing Emissivity Evaluation Methods for Infrared Sources” article written by Stephen D. Scopatz, Jason A. Mazzetta, John E. Sgheiza, and Miguel A. Medina of EOI
Download the paper (Ultraviolet Through Infrared Imager Performance Testing) presented at SPIE Europe Security + Defense - 31 August - 3 September 2009 - Berliner Congress Centre - Berlin, Germany
CTI Forms New Streamlined Company
EOI Introduces New Mobile Target Series
Electro Optical Industries (EOI), Inc. releases the VIP Series, Visible Image Projector, Complete Test & Calibration System (VIP100)

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